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GL系列
The GL sensor family from Gpixel comprises a wide range of horizontal resolutions, ranging from 2k to 16k, with line rates of up to 200 kHz. These sensors feature pixel sizes of 3.5 µm, 5 µm, 7 µm, and 14 µm, providing a comprehensive selection to suit diverse line scan applications.
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Global Shutter
High Speed
TDI
High Resolution
GLT5009BSI
9K BSI TDI (TIME DELAY INTEGRATION) LINE SCAN IMAGE SENSOR
GLT5009BSI is a Backside illuminated (BSI), Time delay integration (TDI), charge domain CMOS image sensor with 5 μm pixels and 9k resolutions. The sensor has two photosensitive bands, 256 stages and 32 stages respectively, enabling a high dynamic range (HDR) imaging mode. GLT5009BSI is designed to meet the needs of high speed and low light applications by maximizing sensitivity from the ultraviolet to the near infrared with state-of-art BSI scientific CMOS technology and up to 256 true TDI stages. It supports line rates up to 608 kHz using 10-bit single band mode and 300 kHz using 12 bit single band mode. The sensor also supports 10 bit dual band HDR mode, employing both 256 stages and 32 stages for HDR image construction. The sensor integrates several features to ease camera integration including an internal sequencer, channel multiplexing, and selectable 2 scan directions. GLT5009BSI is assembled in a 269 pins μPGA ceramic package. GLT5009BSI comes in 2 spectrum variants: a standard variant with a broad spectral response and a dedicated DUV version.
  • Key Features and Benefits

    True Charge Domain Time Delay Integration

    Back Side Illuminated (BSI) Pixels

    High Sensitivity

    High Speed: up to 608 kHz

    HDR Read Out

    QE (266 nm) ≥ 50%
  • Package Drawing
  • QE Curve
GLT5009BSI
GLT5009BSI
产品指标

  • Resolution

    9.0 K

    Nr of Active Pixels

    9072 (H) x (256 + 32) (V)

  • Optical Format

    45.36 mm

    Pixel Size

    5 μm x 5 μm

  • Full Well Capacity

    15.8 ke‾ (10 bit) 15.9 ke‾ (12 bit)

    Temporal Noise

    10.5 e‾ (10 bit) 6.2 e‾ (12 bit)

  • Dynamic Range

    63.5 dB (10 bit) 68.1 dB (12 bit)

    Max Line Rate

    608 kHz (10 bit) 300 kHz (12 bit)

  • Peak QE

    STD : 82.4% (550 nm) DUV : 61% (248 nm)

    Shutter Type

    Global Shutter

  • Photosensive Area

    P1: 45.36 mm × 1.28 mm P2: 45.36 mm × 0.16 mm

    Dark Current

    ~8 ke‾/pix/sec (30℃)

  • Max. SNR

    42 dB

    ADC

    10/12 bit

  • Output Format

    84 ch Sub-LVDS

    Channel Multiplexing

    84/42/21/12/6/3

  • Max. Data Rate

    74.304 Gbps

    Chroma

    Mono

  • Power Consumption

    < 5.8 W (12 bit) < 8.2 W (10 bit)

    Supply Voltage

    5 V (analog) 1.8 V (ADC) 1.8 V (digital)

  • Package

    μPGA 269 pins (61.5 mm x 20.0 mm)

    Availability

    Engineering Samples (ES)

产品编码
  • GLT5009BSI-CBM-NUN-BR1
    269 pins uPGA package.Removable D 263® T eco glass lid with AR coating on both sides,Grade 1
  • GLT5009BSI-CBM-NUN-BU1
    269 pins uPGA package.Sealed D 263® T eco glass lid with AR coating on both sides,Grade 1
  • GLT5009BSI-CUM-NUN-BR1
    269 pins uPGA package.Removable D 263® T eco glass lid with AR coating on both sides. GLT5009BSI-DUV: sensor variant with DUV QE enhanced,Grade 1
  • GLT5009BSI-CBM-NUN-BRE
    269 pins uPGA package.Removable D 263® T eco glass lid with AR coating on both sides,ES
  • GLT5009BSI-CBM-NUN-BUE
    269 pins uPGA package.Sealed D 263® T eco glass lid with AR coating on both sides,ES
  • GLT5009BSI-CUM-NUN-BRE
    269 pins uPGA package.Removable D 263® T eco glass lid with AR coating on both sides. GLT5009BSI-DUV: sensor variant with DUV QE enhanced,ES
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