GL系列
The GL sensor family from Gpixel comprises a wide range of horizontal resolutions, ranging from 2k to 16k, with line rates of up to 200 kHz. These sensors feature pixel sizes of 3.5 µm, 5 µm, 7 µm, and 14 µm, providing a comprehensive selection to suit diverse line scan applications.
Global Shutter
High Speed
TDI
High Resolution
GLT5008BSI
8k BSI TDI (TIME DELAY INTEGRATION) LINE SCAN IMAGE SENSOR
GLT5008BSI is a Backside illuminated (BSI), Time delay integration (TDI), charge domain CMOS image sensor with 5 μm pixels and 8208 effective resolutions. The sensor has two photosensitive bands, 256 stages and 32 stages respectively enabling a high dynamic range (HDR) imaging mode, which is designed to meet the needs of high speed and low light applications by maximizing sensitivity with state-of-art BSI scientific CMOS technology. GLT5008BSI Sensor integrates an on-chip sequencer, supports channel multiplexing and selectable 2 scan directions (Forward and Reverse). It is assembled in a 231 pins μPGA ceramic package for reliability and good heat dissipation.
  • Key Features and Benefits

    True Charge Domain Time Delay Integration

    Back Side Illuminated (BSI) pixels

    High Sensitivity with QE of 63.9% (266 nm) and 93.4% (440 nm)

    High Speed: up to 1 MHz

    HDR Read Out

    On-chip Binning

  • Package Drawing
  • QE Curve
GLT5008BSI
GLT5008BSI
产品指标
  • Resolution

    8.2K

    Nr of Active Pixels

    P1: 8208 pixels x 256 stages P2: 8208 pixels x 32 stages

  • Optical Format

    41.04 mm

    Pixel Size

    5 μm x 5 μm

  • Full Well Capacity

    16.8 ke⁻ (P1,10 bit,single band) 17.8 ke⁻ (P1,12 bit,single band)

    Temporal Noise

    12.1 e⁻ (P1,10 bit,single band) 7.4 e⁻ (P1,12 bit,single band)

  • Dynamic Range

    62.8 dB (P1,10 bit,single band) 67.6 dB (P1,12 bit,single band)

    Max Line Rate

    1M Hz (10 bit) 500k Hz (12 bit)

  • Peak QE

    63.9% (266 nm) 93.4% (440 nm)

    Shutter Type

    Time Delay Integration

  • Photosensive Area

    P1: 41.04 mm x 1.28 mm P2: 41.04 mm x 0.16 mm

    Dark Current

    1 ke⁻/pixel/s (P1 10/12 bit,single band,15 ℃)

  • Max. SNR

    42.3 dB (10 bit)

    ADC

    10/12 bit

  • Output Format

    72 ch Sub-LVDS (10 bit)

    Channel Multiplexing

    72/54/48/36/24/18/12/6 (10 bit)

  • Max. Data Rate

    86.4 Gbps (10 bit)

    Chroma

    Mono

  • Power Consumption

    ≤ 4.1 W (P1,10 bit,1 MHz line rate) ≤ 3.2 W (P1,12 bit,500 kHz line rate)

    Supply Voltage

    3.3 V (analog) 1.65 V (ADC) 1.6 V (digital)

  • Package

    μPGA 231 pins (56.90 mm x 19.00 mm)

    Availability

    Engineering Samples (ES)

产品编码
  • GLT5008BSI-AUM-NUN-BRE
    Normal speed, 500k HZ (12 bit) 54 x Sub-LVDS.231 pins μPGA package.Removable D263® Teco glass lid with AR coating on both sides,ES
  • GLT5008BSI-AUM-HUN-BRE
    High speed, 1M HZ (10 bit) 72 x Sub-LVDS.231 pins μPGA package.Removable D263® Teco glass lid with AR coating on both sides,ES
  • GLT5008BSI-AUM-NUN-BRD
    Normal speed, 500k HZ (12 bit) 54 x Sub-LVDS.231 pins μPGA package.Removable D263® Teco glass lid with AR coating on both sides,Demo Grade
  • GLT5008BSI-AUM-HUN-BRD
    High speed, 1M HZ (10 bit) 72 x Sub-LVDS.231 pins μPGA package.Removable D263® Teco glass lid with AR coating on both sides,Demo Grade
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